Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513084 | Nondestructive inspecting system, and nondestructive inspecting method | Shigenori Nagano, Yoshie OTAKE, Yuichi Yoshimura, Hideyuki Sunaga | 2022-11-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513084 | Nondestructive inspecting system, and nondestructive inspecting method | Shigenori Nagano, Yoshie OTAKE, Yuichi Yoshimura, Hideyuki Sunaga | 2022-11-29 |