Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301978 | Defect inspection device, defect inspection method, and computer readable recording medium | Masashi Kurita | 2022-04-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301978 | Defect inspection device, defect inspection method, and computer readable recording medium | Masashi Kurita | 2022-04-12 |