Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11461996 | Method, apparatus and system for determining feature data of image data, and storage medium | — | 2022-10-04 |
| 11301978 | Defect inspection device, defect inspection method, and computer readable recording medium | Yasuyuki Ikeda | 2022-04-12 |
| 11240441 | Method, device, system and computer-program product for setting lighting condition and storage medium | Yosuke Naruse | 2022-02-01 |