Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11270918 | Laminate structure and test method for detecting inter-metal dielectric layer defects | Xiong Zhang, Peichun Wang, Gang Shi | 2022-03-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11270918 | Laminate structure and test method for detecting inter-metal dielectric layer defects | Xiong Zhang, Peichun Wang, Gang Shi | 2022-03-08 |