Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11268874 | Defect judging unit of measuring probe and defect judging method thereof | Akinori Saito, Hiroyuki Kanamori | 2022-03-08 |
| 11230450 | Sheet feeding apparatus and image forming apparatus | — | 2022-01-25 |