Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11268874 | Defect judging unit of measuring probe and defect judging method thereof | Akinori Saito, Satoshi Koga | 2022-03-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11268874 | Defect judging unit of measuring probe and defect judging method thereof | Akinori Saito, Satoshi Koga | 2022-03-08 |