Issued Patents 2022
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11510643 | Calibration method and apparatus for measurement X-ray CT apparatus, measurement method and apparatus using the same, and measurement X-ray CT apparatus | Hidemitsu Asano | 2022-11-29 |
| 11495444 | Substrate processing apparatus and substrate processing method | — | 2022-11-08 |
| 11361946 | Substrate processing apparatus | — | 2022-06-14 |
| 11346660 | Calibration method of x-ray measuring device | Hiromu MAIE, Seiji Sasaki, Jyota Miyakura | 2022-05-31 |
| 11344276 | Calibration method of x-ray measuring device | Hiromu MAIE, Seiji Sasaki, Jyota Miyakura | 2022-05-31 |
| 11333619 | Measurement X-ray CT apparatus | Seiji Sasaki, Nobuyuki Nakazawa, Hisayoshi Sakai, Hidemitsu Asano | 2022-05-17 |
| 11262319 | Measuring X-ray CT apparatus and production work piece measurement method | Hidemitsu Asano | 2022-03-01 |
| 11234670 | Measuring X-ray CT apparatus and tomographic image generating method | Sadayuki Matsumiya, Hidemitsu Asano | 2022-02-01 |