Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11435560 | Lens substrate stacking position calculating apparatus and program | Kazuhiko Hidaka, Hiromu MAIE | 2022-09-06 |
| 11344276 | Calibration method of x-ray measuring device | Masato Kon, Hiromu MAIE, Seiji Sasaki | 2022-05-31 |
| 11346660 | Calibration method of x-ray measuring device | Masato Kon, Hiromu MAIE, Seiji Sasaki | 2022-05-31 |