Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11402426 | Inductive testing probe apparatus for testing semiconductor die and related systems and methods | Kurt J. Bossart, Jonathan S. Hacker, Chandra S. Tiwari | 2022-08-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11402426 | Inductive testing probe apparatus for testing semiconductor die and related systems and methods | Kurt J. Bossart, Jonathan S. Hacker, Chandra S. Tiwari | 2022-08-02 |