Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11320487 | Programmable test compactor for improving defect determination | Wu-Tung Cheng, Chen Wang | 2022-05-03 |
| 11232246 | Layout-friendly test pattern decompressor | Yu Huang, Janusz Rajski, Nilanjan Mukherjee, Jeffrey Carl Mayer | 2022-01-25 |