Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11320487 | Programmable test compactor for improving defect determination | Wu-Tung Cheng, Mark Kassab | 2022-05-03 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11320487 | Programmable test compactor for improving defect determination | Wu-Tung Cheng, Mark Kassab | 2022-05-03 |