Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486700 | System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patterns | The Manh NGUYEN, Hyug-gyo Rhee | 2022-11-01 |
| 11466978 | Apparatus and method for measuring the thickness and refractive index of multilayer thin films using angle-resolved spectral interference image according to polarization | Hyug-gyo Rhee | 2022-10-11 |
| 11255662 | System and method for compensating for non-linear response characteristic in phase-shifting deflectometry | The-mahn Nguyen, Hyug-gyo Rhee | 2022-02-22 |
| 11243070 | Apparatus and method for multilayer thin film thickness measurement using single-shot angle-resolved spectral reflectometry | Hyug-gyo Rhee | 2022-02-08 |