Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486700 | System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patterns | Young-sik Ghim, Hyug-gyo Rhee | 2022-11-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486700 | System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patterns | Young-sik Ghim, Hyug-gyo Rhee | 2022-11-01 |