Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11333982 | Scaling metric for quantifying metrology sensitivity to process variation | Tal Marciano, Dana Klein | 2022-05-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11333982 | Scaling metric for quantifying metrology sensitivity to process variation | Tal Marciano, Dana Klein | 2022-05-17 |