Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11530913 | Methods and systems for determining quality of semiconductor measurements | Dzmitry Sanko, Stilian Ivanov Pandev | 2022-12-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11530913 | Methods and systems for determining quality of semiconductor measurements | Dzmitry Sanko, Stilian Ivanov Pandev | 2022-12-20 |