Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11249400 | Per-site residuals analysis for accurate metrology measurements | Tal Marciano, Dana Klein | 2022-02-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11249400 | Per-site residuals analysis for accurate metrology measurements | Tal Marciano, Dana Klein | 2022-02-15 |