Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410291 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2022-08-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410291 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2022-08-09 |