Issued Patents 2022
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11441992 | Method and apparatus for detection of particle size in a fluid | Todd Egan, Guoheng Zhao | 2022-09-13 |
| 11442000 | In-situ, real-time detection of particulate defects in a fluid | Sankesha Bhoyar, Rachit Sharma, Guoheng Zhao | 2022-09-13 |
| 11417010 | Image based metrology of surface deformations | Guoheng Zhao | 2022-08-16 |
| 11353389 | Method and apparatus for detection of particle size in a fluid | Avishek Ghosh | 2022-06-07 |
| 11309163 | Multibeamlet charged particle device and method | Christopher Dennis Bencher, Krishna Sreerambhatla, Hussein Fawaz, Lior ENGEL, Robert Perlmutter | 2022-04-19 |