Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442024 | Defect classification device, inspection device, and inspection system | Takanori Kondo, Toshifumi Honda, Akira Hamamatsu, Hideo Ota | 2022-09-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442024 | Defect classification device, inspection device, and inspection system | Takanori Kondo, Toshifumi Honda, Akira Hamamatsu, Hideo Ota | 2022-09-13 |