Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442024 | Defect classification device, inspection device, and inspection system | Takanori Kondo, Akira Hamamatsu, Hideo Ota, Yoshio Kimoto | 2022-09-13 |
| 11346791 | Inspection device and inspection method thereof | Masami Makuuchi, Nobuhiro Obara, Shunichi Matsumoto, Akira Hamamatsu | 2022-05-31 |