Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513138 | Semiconductor inspection device and probe unit | Katsuo Oki | 2022-11-29 |
| 11391756 | Probe module and probe | Ryo HIRANO, Takayuki Mizuno, Tomohisa Ohtaki, Toru Fujimura, Shigehiko Kato +3 more | 2022-07-19 |