Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513079 | Method and system for wafer defect inspection | Roger Alvis, John Fretwell, Laurens Franz Taemsz Kwakman | 2022-11-29 |
| 11476079 | Method and system for imaging a multi-pillar sample | Jakub Kuba, Magda Zaoralova | 2022-10-18 |