Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513079 | Method and system for wafer defect inspection | John Fretwell, Laurens Franz Taemsz Kwakman, Tomas Vystavel | 2022-11-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513079 | Method and system for wafer defect inspection | John Fretwell, Laurens Franz Taemsz Kwakman, Tomas Vystavel | 2022-11-29 |