Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11525853 | Temperature test apparatus and temperature test method | Takeshi Kobayashi, Yasuhiko Nago | 2022-12-13 |
| 11500004 | Test apparatus and test method | Hiroyuki Baba | 2022-11-15 |
| 11462841 | Antenna apparatus and measurement method | Aya Yamamoto | 2022-10-04 |