Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11423529 | Determination of defect location for examination of a specimen | Doron Girmonsky, Rafael Ben Ami, Boaz Cohen | 2022-08-23 |
DS
Dror Shemesh
Overall (2022): #468,841 of 548,613Top 90%
1
Patents 2022