Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11346818 | Method, device and system for non-destructive detection of defects in a semiconductor die | Mario Pacheco, Jacob Woolsey, Deepak Goyal | 2022-05-31 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11346818 | Method, device and system for non-destructive detection of defects in a semiconductor die | Mario Pacheco, Jacob Woolsey, Deepak Goyal | 2022-05-31 |