Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11506709 | X-ray filter | Deepak Goyal | 2022-11-22 |
| 11346818 | Method, device and system for non-destructive detection of defects in a semiconductor die | Odissei Touzanov, Jacob Woolsey, Deepak Goyal | 2022-05-31 |