Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11450613 | Integrated circuit package with test circuitry for testing a channel between dies | Jong-Ru Guo, Zhiguo Qian, Zuoguo Wu | 2022-09-20 |
| 11226353 | Integrated cable probe design for high bandwidth RF testing | Chengqing Hu, Simranjit S. Khalsa, Deepak Goyal | 2022-01-18 |