Issued Patents 2022
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507670 | Method for testing an artificial intelligence model using a substitute model | Lukasz G. Cmielowski, Rafal Bigaj, Maksymilian Erazmus | 2022-11-22 |
| 11501239 | Metric specific machine learning model improvement through metric specific outlier removal | Lukasz G. Cmielowski, Maksymilian Erazmus, Rafal Bigaj | 2022-11-15 |
| 11488036 | Multi-class classification evaluation metric determination | Rafal Bigaj, Lukasz G. Cmielowski, Bartlomiej T. Malecki | 2022-11-01 |
| 11475324 | Dynamic recommendation system for correlated metrics and key performance indicators | Lukasz G. Cmielowski, Maksymilian Erazmus, Rafal Bigaj | 2022-10-18 |
| 11475326 | Analyzing test result failures using artificial intelligence models | Lukasz G. Cmielowski, Maksymilian Erazmus, Rafal Bigaj | 2022-10-18 |
| 11461648 | Standardizing disparate data points | Lukasz G. Cmielowski, Maksymilian Erazmus, Rafal Bigaj | 2022-10-04 |
| 11429858 | Deep learning experiment content generation based on single design | Lukasz G. Cmielowski, Rafal Bigaj, Pawel Slowikowski | 2022-08-30 |
| 11410271 | Reconstructing missing slices in slice-based scans of 3D objects | Maria Hanna Oleszkiewicz, Blazej Rafal Rutkowski, Piotr Padkowski | 2022-08-09 |
| 11301351 | Machine learning based data monitoring | Rafal Bigaj, Lukasz G. Cmielowski, Maksymilian Erazmus | 2022-04-12 |
| 11237942 | Model comparison with unknown metric importance | Lukasz G. Cmielowski, Rafal Bigaj, Maksymilian Erazmus | 2022-02-01 |