Issued Patents 2022
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507670 | Method for testing an artificial intelligence model using a substitute model | Lukasz G. Cmielowski, Rafal Bigaj, Wojciech Sobala | 2022-11-22 |
| 11501239 | Metric specific machine learning model improvement through metric specific outlier removal | Lukasz G. Cmielowski, Wojciech Sobala, Rafal Bigaj | 2022-11-15 |
| 11475324 | Dynamic recommendation system for correlated metrics and key performance indicators | Lukasz G. Cmielowski, Rafal Bigaj, Wojciech Sobala | 2022-10-18 |
| 11475326 | Analyzing test result failures using artificial intelligence models | Lukasz G. Cmielowski, Rafal Bigaj, Wojciech Sobala | 2022-10-18 |
| 11461648 | Standardizing disparate data points | Lukasz G. Cmielowski, Rafal Bigaj, Wojciech Sobala | 2022-10-04 |
| 11301351 | Machine learning based data monitoring | Rafal Bigaj, Lukasz G. Cmielowski, Wojciech Sobala | 2022-04-12 |
| 11237942 | Model comparison with unknown metric importance | Lukasz G. Cmielowski, Wojciech Sobala, Rafal Bigaj | 2022-02-01 |