Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11474143 | Testing apparatus | Makoto Kobayashi, Okito Umehara, Yoshinobu Saito, Hirohide Yano, Kazunari Tamura | 2022-10-18 |
| 11402310 | Measuring apparatus for measuring a flexural strength of a test piece | Yoshinobu Saito | 2022-08-02 |
| 11340163 | Method and apparatus for detecting facet region, wafer producing method, and laser processing apparatus | Naoki MURAZAWA, Kazuya Hirata | 2022-05-24 |