Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11340286 | On-wafer S-parameter calibration method | Aihua Wu, Chong Li, Chen Liu, Yibang Wang, Xingchang Fu +3 more | 2022-05-24 |
| 11275103 | Calibration method, system and device of on-wafer s parameter of vector network analyzer | Yibang Wang, Aihua Wu, Faguo Liang, Chen Liu, Xuefeng Zou +2 more | 2022-03-15 |