Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11521826 | Optical height detection system | Jian Zhang, Zhiwen KANG | 2022-12-06 |
| 11482399 | Method and apparatus for an advanced charged controller for wafer inspection | Jian Zhang, Qing Chen | 2022-10-25 |