Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11482399 | Method and apparatus for an advanced charged controller for wafer inspection | Jian Zhang, Yixiang Wang | 2022-10-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11482399 | Method and apparatus for an advanced charged controller for wafer inspection | Jian Zhang, Yixiang Wang | 2022-10-25 |