Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442372 | Method of measuring an alignment mark or an alignment mark assembly, alignment system, and lithographic tool | Franciscus Godefridus Casper Bijnen | 2022-09-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442372 | Method of measuring an alignment mark or an alignment mark assembly, alignment system, and lithographic tool | Franciscus Godefridus Casper Bijnen | 2022-09-13 |