Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11501949 | Wafer inspection based on electron beam induced current | — | 2022-11-15 |
| 11469076 | System and method for scanning a sample using multi-beam inspection apparatus | Martinus Gerardus Maria Johannes Massen, Joost Jeroen Ottens, Youfei Jiang, Weihua Yin, Wei Li +1 more | 2022-10-11 |
| 11340065 | Optical fiber inclination measurement apparatus and differential inclination measurement system | Shaodong Jiang, Chang Wang, Qingchao Zhao, Yingying Wang, Faxiang Zhang +4 more | 2022-05-24 |
| 11246450 | Stirring rib, stirring mechanism and cooking robot | Ze Lin | 2022-02-15 |