Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11443083 | Identification of hot spots or defects by machine learning | Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen, Yen-Wen Lu +1 more | 2022-09-13 |
| 11404840 | Device and method for measuring thermal load caused by excited state absorption in laser gain crystal | Huiqi Yang, Huadong LU, Kunchi PENG | 2022-08-02 |
| 11232249 | Method for determining curvilinear patterns for patterning device | Quan Zhang, Been-Der Chen, Rafael C. Howell, Yi Zou, Yen-Wen Lu | 2022-01-25 |