Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11386539 | Detecting defects in a semiconductor specimen | Elad Cohen, Yuri Feigin, Eyal NEISTEIN | 2022-07-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11386539 | Detecting defects in a semiconductor specimen | Elad Cohen, Yuri Feigin, Eyal NEISTEIN | 2022-07-12 |