Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11386539 | Detecting defects in a semiconductor specimen | Yuri Feigin, Lior Katz, Eyal NEISTEIN | 2022-07-12 |
| 11303662 | Security indicator scores | Ofer Bachner, Meytal Maor | 2022-04-12 |
EC
Elad Cohen
Micro Focus: 1 patents #52 of 177Top 30%
Overall (2022): #162,636 of 548,613Top 30%
2
Patents 2022