Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11187740 | Time dependent dielectric breakdown test structure and test method thereof | Shengwei Yang | 2021-11-30 |
| 11114434 | Computation-in-memory in three-dimensional memory device | Shengwei Yang, Zhongyi Xia | 2021-09-07 |
| 11114453 | Bonded memory device and fabrication methods thereof | Shengwei Yang, Zhongyi Xia, Kang Li, Xiaoguang Wang, Hongbin Zhu | 2021-09-07 |