Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11043369 | Sample analyzer and sample analysis method | Teruyuki Kinno | 2021-06-22 |
| 10916405 | Atom probe inspection device, field ion microscope, and distortion correction method | Takahiro Ikeda, Haruko Akutsu | 2021-02-09 |