Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11062894 | Mass spectrometer and mass spectrometry method | Reiko Saito, Tetsuo Sakamoto, Akio Takano | 2021-07-13 |
| 10916405 | Atom probe inspection device, field ion microscope, and distortion correction method | Takahiro Ikeda, Akira KURAMOTO | 2021-02-09 |