Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11009544 | Inspection system, wafer map display, wafer map display method, and computer program | Tetsuya Kagami | 2021-05-18 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11009544 | Inspection system, wafer map display, wafer map display method, and computer program | Tetsuya Kagami | 2021-05-18 |