Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11073551 | Method and system for wafer-level testing | Jun He, Yu-Ting Lin, Wei-Hsun Lin, Yinlung Lu | 2021-07-27 |
YK
Yung-Liang Kuo
Overall (2021): #194,643 of 548,734Top 40%
1
Patents 2021