Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11121046 | Wafer-level testing method and test structure thereof | Pei-Hsuan Lee, Yu-Hsuan Huang | 2021-09-14 |
CK
Chia-Chia Kan
Overall (2021): #500,220 of 548,734Top 95%
1
Patents 2021