Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10998077 | Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory | Shishir Kumar, Tanmoy Roy, Deepak Kumar Bihani | 2021-05-04 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10998077 | Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory | Shishir Kumar, Tanmoy Roy, Deepak Kumar Bihani | 2021-05-04 |