Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11025252 | Circuit for detection of single bit upsets in generation of internal clock for memory | Shishir Kumar, Tanuj KUMAR | 2021-06-01 |
| 10998077 | Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory | Rohit Bhasin, Shishir Kumar, Tanmoy Roy | 2021-05-04 |