Issued Patents 2021
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175243 | X-ray dark-field in-line inspection for semiconductor samples | Sylvia Jia Yun Lewis, Janos Kirz | 2021-11-16 |
| 11152183 | X-ray source with rotating anode at atmospheric pressure | Janos Kirz, William H. Hansen | 2021-10-19 |
| 11143605 | System and method for computed laminography x-ray fluorescence imaging | Sylvia Jia Yun Lewis, Janos Kirz, Benjamin Donald Stripe | 2021-10-12 |
| 11056308 | System and method for depth-selectable x-ray analysis | Janos Kirz | 2021-07-06 |
| RE48612 | X-ray interferometric imaging system | Sylvia Jia Yun Lewis, Janos Kirz | 2021-06-29 |
| 10991538 | High brightness x-ray reflection source | Sylvia Jia Yun Lewis, Janos Kirz, William H. Hansen | 2021-04-27 |
| 10989822 | Wavelength dispersive x-ray spectrometer | Janos Kirz, Benjamin Donald Stripe | 2021-04-27 |
| 10976273 | X-ray spectrometer system | Srivatsan Seshadri, Janos Kirz, Sylvia Jia Yun Lewis | 2021-04-13 |
| 10962491 | System and method for x-ray fluorescence with filtering | Janos Kirz, Benjamin Donald Stripe, Sylvia Jia Yun Lewis | 2021-03-30 |