Issued Patents 2021
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175243 | X-ray dark-field in-line inspection for semiconductor samples | Wenbing Yun, Janos Kirz | 2021-11-16 |
| 11143605 | System and method for computed laminography x-ray fluorescence imaging | Wenbing Yun, Janos Kirz, Benjamin Donald Stripe | 2021-10-12 |
| RE48612 | X-ray interferometric imaging system | Wenbing Yun, Janos Kirz | 2021-06-29 |
| 10991538 | High brightness x-ray reflection source | Wenbing Yun, Janos Kirz, William H. Hansen | 2021-04-27 |
| 10976273 | X-ray spectrometer system | Wenbing Yun, Srivatsan Seshadri, Janos Kirz | 2021-04-13 |
| 10962491 | System and method for x-ray fluorescence with filtering | Wenbing Yun, Janos Kirz, Benjamin Donald Stripe | 2021-03-30 |