Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11175220 | Surface defect measuring apparatus and method by microscopic scattering polarization imaging | Jianda Shao, Shijie Liu, Shenghao Wang, You Zhou, Weiwei WANG +2 more | 2021-11-16 |